2019There are 2281 products.

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  IEC 61892-6 Ed. 4.0 b:2019

  IEC 61892-6 Ed. 4.0 b:2019 Mobile and fixed offshore units - Electrical installations - Part 6: Installation standard by International Electrotechnical Commission, 04/09/2019 ...

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  IEC 62386-220 Ed. 1.0 b:2019

  IEC 62386-220 Ed. 1.0 b:2019 Digital addressable lighting interface - Part 220: Particular requirements for control gear - Centrally supplied emergency operation (device type 19) standard by

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  IEC 61156-11 Ed. 1.0 en:2019

  IEC 61156-11 Ed. 1.0 en:2019 Multicore and symmetrical pair/quad cables for digital communications - Part 11: Symmetrical single pair cables with transmission characteristics up to 600 MHz - Horizontal floor wiring - Sectional specification

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  IEC 60898-3 Ed. 1.0 en:2019

  IEC 60898-3 Ed. 1.0 en:2019 Electrical accessories - Circuit-breakers for overcurrent protection for household and similar installations - Part 3: Circuit-breakers for DC operation standard by

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  IEC 60674-2 Ed. 2.1 b:2019

  IEC 60674-2 Ed. 2.1 b:2019 Specification for plastic films for electrical purposes - Part 2: Methods of test CONSOLIDATED EDITION standard by International Electrotechnical Commission,...

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  IEC 60255-181 Ed. 1.0 b:2019

  IEC 60255-181 Ed. 1.0 b:2019 Measuring relays and protection equipment - Part 181: Functional requirements for frequency protection standard by International Electrotechnical...

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  IEC 60384-17 Ed. 3.0 b:2019

  IEC 60384-17 Ed. 3.0 b:2019 Fixed capacitors for use in electronic equipment - Part 17: Sectional specification - Fixed metallized polypropylene film dielectric AC and pulse capacitors standard by

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  IEC 60122-4 Ed. 1.0 b:2019

  IEC 60122-4 Ed. 1.0 b:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors standard by International Electrotechnical Commission, 01/24/2019 ...

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  IEC 63068-2 Ed. 1.0 en:2019

  IEC 63068-2 Ed. 1.0 en:2019 Semiconductor devices ¿¿¿ Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection

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  IEC 63068-1 Ed. 1.0 en:2019

  IEC 63068-1 Ed. 1.0 en:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects standard by

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