IEC 62047-49 Ed. 1.0 en:2025

IEC 62047-49 Ed. 1.0 en:2025

IEC 62047-49 Ed. 1.0 en:2025 Semiconductor devices - Micro-electromechanical devices - Part 49: Temperature and humidity test methods for piezoelectric MEMS cantilevers

standard byInternational Electrotechnical Commission , 11/01/2025

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IEC 62047-49:2025 This part of IEC 62047 specifies reliability test methods of electro-mechanical conversion characteristics of piezoelectric thin film on microcantilever, which is typical structure of micro sensors and micro actuators. In order to estimate the stability of the piezoelectric coefficient of the piezoelectric thin films with microscale structures in the operating conditions, this document reports the schema to determine the characteristic parameters for consumer, industry or any other applications of piezoelectric MEMS devices. This document applies to piezoelectric thin films on microcantilever fabricated by MEMS process.

Product Details

Edition:

1.0

Published:

11/01/2025

ISBN(s):

9782832708583

Number of Pages:

12

File Size:

1 file , 257 Bytes

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus

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