IEC 62047-43 Ed. 1.0 en:2024
IEC 62047-43 Ed. 1.0 en:2024
Semiconductor devices – Micro-electromechanical devices – Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devicesstandard by International Electrotechnical Commission , 03/01/2024