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IEC 60749-17 Ed. 2.0 b:2019

IEC 60749-17 Ed. 2.0 b:2019 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

standard by International Electrotechnical Commission, 03/28/2019

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IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

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Published: 03/28/2019 Number of Pages: 17 File Size: 1 file , 1000 KB

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