IEEE C62.36-2000

IEEE C62.36-2000 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
standard by IEEE, 10/13/2000

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Full Description

Scope

This standard applies to surge protectors for application on multiconductor balanced or unbalanced data,communications, and signaling circuits with voltages equal to or less than 1000 V rms, or 1200 V dc. Thesesurge protectors are designed to limit voltage surges, current surges, or both.This standard describes the methods of testing and criteria for determining the end of life of electrical surge protectors used in low-voltage data, communications, and signaling circuits. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements, packaged for the purpose of limiting voltage, current, or both.This standard is not intended to cover packaged single gas tube, air gap, varistor, or avalanche junction surge-protective devices, which are included in IEEE Std C62.31-1987, IEEE Std C62.32-1981, IEEE Std C62.33-1982, and IEEE Std C62.35-1987, respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For protection of wire-line communication facilities under the specialized conditions found at power stations, consult IEEE Std 487-1992.The tests in this standard are intended as design tests, as defined in the IEEE Dictionary [B1], and provide a means of comparison among various multiple-component surge protectors.The test criteria and definitions of this standard provide a common engineering language beneficial to users and manufacturers of multiple-component surge protectors.

Purpose

Revisions to C62.36-1994 are needed to more fully cover protectors addressing the fast-paced introduction of broadband circuits in the wire-line communications industry. In addition, there is growing recognition that multiport protectors can help avoid surge damage to electronic components that increasingly interrface with more than one type of wire-line circuit. The proposed changes and additions address the test methods for these emerging products.

Abstract

Revision Standard - Superseded.Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 Vdc. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.