This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Purpose
The purpose of this standard is to provide a method for systematically characterizing organic transistors.These standards are intended to maximize reproducibility of published results by providing a frameworkfor testing organic devices, whose unique properties cause measurement issues not typically encounteredwith inorganic devices. This standard stresses disclosure of the procedures used to measure data and extractparameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data,so that information is clear and consistent throughout the research community and industry.
Abstract
Revision Standard - Active.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.