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IEEE 1445-2016

IEEE 1445-2016 IEEE Standard for Digital Test Interchange Format (DTIF)

standard by IEEE, 01/27/2017

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Full Description

Scope

This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE).

Purpose

This standard is to be used as the standard definition of DATPG output formats and informational content.

Abstract

Revision Standard - Active.The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.

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